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Appendix I
Additional Program Information
B. Course Syllabi for Materials Engineering
1. Course Name: Mat E 214 Structural Characterization of Materials
2. Catalog Description: Mat E 214. Structural Characterization of Materials. (1-6) Cr. 3. S. Structural characterization of ceramic, electronic, polymeric and metallic materials. Techniques include optical and electron microscopy, x-ray diffraction, and thermal analysis methods. Identification of materials type, microstructure, and crystal structure.
3. Prerequisites: Credit or enrollment in Phys 221.
4. Textbook/Materials: Handouts given and reference books placed on reserve at the library. Reference books include texts such as Elements of X-ray Diffraction, B.D. Cullity; Scanning Electron Microscopy and X-ray Microanalysis, Goldstein et. al.; Handbook of Thermal Analysis, T. Hatakeyama & Z. Lin; Thermal Methods, Dodd and Tonge; and Optical Microscopy for the Materials Sciences, Richardson. Notes and information included on the course web page http://www.mse.iastate.edu/mate214.
5. Course Learning Objectives:
The student will:
&Mac183; Be able to mount and polish a sample for optical examination.
&Mac183; Be able to operate and use an optical microscope to obtain micrographs from any material. This includes operation of the digital cameras. They will also know how to use image analysis software.
&Mac183; Be able to operate and use thermal analysis equipment (DTA, DSC, TMA etc.) to determine temperature events of materials. This includes an understanding of sample size constraints, sample preparation, and the control software. The student will also be able to analyze and interpret data to understand the chemical or physical changes that take place in samples such as thermal decomposition, enthalpy of fusion or phase transformation, and coefficient of thermal expansion.
&Mac183; Be able to operate and use an x-ray diffractometer to identify an unknown material and determine its crystal structure. This includes an understanding of sample size constraints and the control software.
&Mac183; Be able to operate and use the department SEM to obtain a secondary electron image from a sample. They will also be able to use the energy dispersive system to obtain the characteristic x-rays from a sample. This includes an understanding of sample size constraints and the control software.
&Mac183; Be able to use all of these techniques to characterize materials such that they can deduce, for example, such things as thermo-mechanical history, production method, and estimated mechanical and physical properties of samples.
6. Topics Covered
&Mac183; Sample Mounting and Sample Polishing
&Mac183; Optical Microscopy
&Mac183; Quantitative Microscopy
&Mac183; Thermomechanical Analysis
&Mac183; Thermogravimetric Analysis
&Mac183; Differential Scanning Calorimetry
&Mac183; X-ray Diffraction
&Mac183; Scanning Electron Microscopy
&Mac183; Energy Dispersive Spectroscopy
7. Class/Laboratory Schedule: Class T 8-8:50, Lab A: TR 9-12, Lab B: TR 1-4
8. Professional Component: Mat E 214 contributes 3 credits toward Engineering Topics and by providing hands-on instruction in techniques whose operation is based on application of basic mathematics, physics, and chemistry principles. Students apply and/or integrate the knowledge obtained in these basic courses when acquiring and evaluating data.
9. Relationship of Course to Program Learning Outcomes and Program Educational Objectives: Objectives: A, C, E Outcomes: a, b, d, g, k-o (significant), e (moderate)
10. Prepared by: Mufit Akinc and Scott Chumbley, 1/10/00, rev. 5/24/00 KPC
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